P. Riello et al., DETERMINING THE DEGREE OF CRYSTALLINITY IN SEMICRYSTALLINE MATERIALS BY MEANS OF THE RIETVELD ANALYSIS, Journal of applied crystallography, 28, 1995, pp. 121-126
Rietveld analysis has enabled a determination, by an internal approach
, of the degree of crystallinity of a sample of polyethylene terephtha
late (PET) and three samples of zirconium oxide obtained by precipitat
ion from ZrOCl2 followed by crystallization at a different temperature
. After subtraction of the air scattering, a global diffuse scattering
produced by the amorphous phase, by the thermal and lattice disorder
and, lastly, by the incoherent or Compton scattering, was built up in
the frame of the DBWS-9006PC computer program written by Sakthivel and
Young [(1990), Georgia Institute of Technology, Atlanta, GA, USA], mo
dified as described by Riello, Fagherazzi, Clemente and Canton [J. App
l. Cryst. (1995), 28, 115-120]. All these contributions (and the corre
sponding spending scale factors) were simultaneously optimized, togeth
er with the crystalline peak profiles. On the basis of the modified Ri
etveld analysis, an equation has been suggested that calculates the de
gree of crystallinity. The value found in the examined PET sample is v
ery close to that already calculated [Polizzi, Fagherazzi, Benedetti,
Battagliarin and Asano (1990). J. Appl. Cryst. 23, 359-365] with nonst
ructural fitting procedure.