DOMAIN BEHAVIOR IN LEAD-ZIRCONATE-TITANATE (PZT) THIN-FILM CAPACITORS

Domain behavior based on surface energy and volumetric free energy was discussed in relation to imprint. Surface enery and volumetric free e nergy result in net free energy, which determines the critical size fo r domain growth. If a domain size is greater than the critical size, t hey will grow spontaneously under a constant electric field or even un der zero electric field. Sometimes, they can grow to the extent that t hey dominate reverse domains. This phenomenon appears to be polarizati on reversal under zero voltage bias. Spontaneous domain growth either under zero electric field or a constant electric field was demonstratr ed. This phenomenon can be partly a source of asymmetric imprint mecha nism.