Thin film waveguides of ferroelectric materials hold great promise for
use in active integrated optics devices because of the high optical c
onfinement possible in a thin film structure. KNbO3 is an attractive m
aterial for active devices because it possesses large nonlinear optica
l susceptibilities and large electro-optic coefficients. KNbO3 films w
ith low optical losses are required to produce efficient devices. Epit
axial films of KNbO3 (110) have previously been deposited on single cr
ystal MgO (100) using ion beam sputtering techniques. However, these f
ilms contained microstructural defects due to the large lattice mismat
ch (>4.0%) between KNbO3 and MgO which resulted in high optical losses
. Recent work has focused on determining the relationships between mic
rostructure and optical loss through the use of lattice matched substr
ates. Film composition, epitaxial quality and optical properties of KN
bO3 films deposited on MgO and MgAl2O4 have been investigated and are
compared.