An analytical single-piece MOSFET substrate current model for circuit
simulation is presented. The model, combined with a unified and contin
uous-channel current model, is valid and continuous through all operat
ing regimes (including weak inversion), for both conventional and LDD
MOSFETs. To include the weak avalanche regime the effects of the volta
ge drop in the substrate resistance have been accounted for in the cha
nnel and substrate currents, and in the total charge equations. The ac
curacy of the model (for currents and their derivatives) has been conf
irmed by comparison with measurements. The model is very useful for th
e design of submicron CMOS circuits. Copyright (C) 1996 Elsevier Scien
ce Ltd