D. Franke et H. Roehle, HIGHLY REPRODUCIBLE AND DEFECT-FREE MOVPE OVERGROWTH OF INGAASP-BASEDDFB GRATINGS, Journal of crystal growth, 170(1-4), 1997, pp. 113-116
The paper reports on a study aiming to develop a highly reproducible p
rocess for the MOVPE overgrowth of first-order gratings made by reacti
ve ion etching in InGaAsP. MOVPE parameters were elaborated, which gua
rantee both nearly perfect preservation of the gratings and an almost
defect-free surface of the regrown InP layer. Whereas the former goal
calls for a low growth temperature, the latter was found to be achieva
ble only above a critical growth temperature depending on the growth r
ate adjusted. As a good compromise, a regrowth starting temperature of
550 degrees C and an extremely high V/III ratio in the initial stage
of regrowth have been chosen. Furthermore, a well-adjusted concentrati
on of AsH3 has been added during the heat-up cycle.