HIGHLY REPRODUCIBLE AND DEFECT-FREE MOVPE OVERGROWTH OF INGAASP-BASEDDFB GRATINGS

Authors
Citation
D. Franke et H. Roehle, HIGHLY REPRODUCIBLE AND DEFECT-FREE MOVPE OVERGROWTH OF INGAASP-BASEDDFB GRATINGS, Journal of crystal growth, 170(1-4), 1997, pp. 113-116
Citations number
3
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
170
Issue
1-4
Year of publication
1997
Pages
113 - 116
Database
ISI
SICI code
0022-0248(1997)170:1-4<113:HRADMO>2.0.ZU;2-3
Abstract
The paper reports on a study aiming to develop a highly reproducible p rocess for the MOVPE overgrowth of first-order gratings made by reacti ve ion etching in InGaAsP. MOVPE parameters were elaborated, which gua rantee both nearly perfect preservation of the gratings and an almost defect-free surface of the regrown InP layer. Whereas the former goal calls for a low growth temperature, the latter was found to be achieva ble only above a critical growth temperature depending on the growth r ate adjusted. As a good compromise, a regrowth starting temperature of 550 degrees C and an extremely high V/III ratio in the initial stage of regrowth have been chosen. Furthermore, a well-adjusted concentrati on of AsH3 has been added during the heat-up cycle.