CORRELATION OF ORDERING FORMATION AND SURFACE-STRUCTURE IN (GAIN)P USING MODULATED MOVPE

Citation
Z. Spika et al., CORRELATION OF ORDERING FORMATION AND SURFACE-STRUCTURE IN (GAIN)P USING MODULATED MOVPE, Journal of crystal growth, 170(1-4), 1997, pp. 257-262
Citations number
19
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
170
Issue
1-4
Year of publication
1997
Pages
257 - 262
Database
ISI
SICI code
0022-0248(1997)170:1-4<257:COOFAS>2.0.ZU;2-H
Abstract
Modulated metalorganic vapour phase epitaxial growth (MOVPE) is used t o clarify the role of the surface conditions on the ordering behaviour in ternary (GaIn)P layers. The alternating deposition of GaP and InP layers with individual thicknesses of up to one monolayer is successfu lly used for the growth of (GaIn)P bulk layers lattice matched to (100 ) GaAs substrates with various off-orientations. The layer quality and the degree of ordering are investigated using high-resolution X-ray d iffraction (XRD), transmission electron microscopy (TEM), and photolum inescence spectroscopy (PL), respectively. The application of modulate d growth conditions for the deposition of (GaIn)P bulk layers has a st rong influence on the degree of ordering achieved in the intermediate growth temperature regime where the highest degree of ordering occurs under continuous MOVPE, Beside a new boundary structure observed in la yers grown under modulated flux conditions, the successful growth of h ighly ordered (GaIn)P layers grown using the modulated MOVPE technique support the model that up to 2 monolayers of the (GaIn)P growth surfa ce are involved in the ordering formation process.