GaN epilayers have been grown on (0001) sapphire substrates with a spe
cially designed two-flow horizontal metalorganic vapor phase epitaxy (
MOVPE) reactor. Epilayers with flat and smooth surfaces were obtained
at the growth temperature of 950 degrees C with relatively low source
supply rates, This indicates a relatively high growth efficiency of th
e reactor, Characterization by photoluminescence, X-ray diffraction an
d Hall measurements reveal that the epilayers are of reasonably high q
uality.