GROWTH OF HIGH-QUALITY ZNSE ON CLOSELY LATTICE-MATCHED INGAAS SUBSTRATES BY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION

Citation
Mj. Bevan et al., GROWTH OF HIGH-QUALITY ZNSE ON CLOSELY LATTICE-MATCHED INGAAS SUBSTRATES BY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of crystal growth, 170(1-4), 1997, pp. 467-471
Citations number
7
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
170
Issue
1-4
Year of publication
1997
Pages
467 - 471
Database
ISI
SICI code
0022-0248(1997)170:1-4<467:GOHZOC>2.0.ZU;2-Q
Abstract
Epitaxial ZnSe layers have been grown by metal organic chemical vapor deposition (MOCVD) on GaAs and InGaAs substrates over the temperature range 400-500 degrees C, using either diisopropyl selenide or diethyl selenide with diethyl zinc. The latter combination leads to improved o ptical and crystal quality at a growth temperature of 500 degrees C. T he narrowest double crystal rocking curve width is 100 arcsec in the l attice-matched case with a 3.5% InAs content in the InGaAs substrate, comparable to films grown by molecular beam epitaxy (MBE). Both n- and p-type dopants have been incorporated to fabricate p/n homojunction s tructures.