SELECTIVE-AREA MOCVD GROWTH FOR 1.3-MU-M LASER-DIODES WITH A MONOLITHICALLY INTEGRATED WAVE-GUIDE LENS
Citation
T. Takiguchi et al., SELECTIVE-AREA MOCVD GROWTH FOR 1.3-MU-M LASER-DIODES WITH A MONOLITHICALLY INTEGRATED WAVE-GUIDE LENS, Journal of crystal growth, 170(1-4), 1997, pp. 705-709
Categorie Soggetti
Crystallography
SICI code
0022-0248(1997)170:1-4<705:SMGF1L>2.0.ZU;2-K
Abstract
A tapered thickness profile and a high thickness enhancement ratio of
3.5 in the waveguide which are necessary for a narrow beam have been r
ealized by selective-area metalorganic chemical vapor deposition (MOCV
D) growth using a tapered shape twin mask. A multiple quantum well (MQ
W) active layer with high strain of 0.9% which is effective for a low
threshold current has also been successfully grown by the control of t
he compositional modulation of InGaAsP in the selective-area growth. U
sing these techniques, a narrow beam and a low threshold current have
been realized for a 1.3 mu m laser diode monolithically integrated wit
h a tapered thickness waveguide lens.