SELECTIVE-AREA MOCVD GROWTH FOR 1.3-MU-M LASER-DIODES WITH A MONOLITHICALLY INTEGRATED WAVE-GUIDE LENS

Citation
T. Takiguchi et al., SELECTIVE-AREA MOCVD GROWTH FOR 1.3-MU-M LASER-DIODES WITH A MONOLITHICALLY INTEGRATED WAVE-GUIDE LENS, Journal of crystal growth, 170(1-4), 1997, pp. 705-709
Citations number
7
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
170
Issue
1-4
Year of publication
1997
Pages
705 - 709
Database
ISI
SICI code
0022-0248(1997)170:1-4<705:SMGF1L>2.0.ZU;2-K
Abstract
A tapered thickness profile and a high thickness enhancement ratio of 3.5 in the waveguide which are necessary for a narrow beam have been r ealized by selective-area metalorganic chemical vapor deposition (MOCV D) growth using a tapered shape twin mask. A multiple quantum well (MQ W) active layer with high strain of 0.9% which is effective for a low threshold current has also been successfully grown by the control of t he compositional modulation of InGaAsP in the selective-area growth. U sing these techniques, a narrow beam and a low threshold current have been realized for a 1.3 mu m laser diode monolithically integrated wit h a tapered thickness waveguide lens.