Sj. Lycett et al., UNIFORM INTERMIXING OF QUANTUM-WELLS IN P-I-N MODULATOR STRUCTURES BYIMPURITY FREE VACANCY DIFFUSION, Journal of electronic materials, 24(3), 1995, pp. 197-202
We present the results of an investigation of impurity free vacancy di
ffusion (IFVD) post-growth treatments of p-i-n modulator structures. T
he investigation is in two parts. We first establish that gallium vaca
ncies (V-Ga) are produced during IFVD (by measuring the intensity of t
he low temperature 1.2 eV signal from Si-V-Ga complexes) in a thick Si
-doped GaAs sample. The second part of this work investigates the degr
ee of intermixing of three 80 Angstrom GaAs quantum wells embedded in
the intrinsic region of a p-i-n modulator at depths between 1-2 mu m f
rom the surface. Photoluminescence studies on etched samples and catho
deluminescence showed that no significant depth dependence occurs as a
result of IFVD.