A STUDY OF THE VALIDITY OF CAPACITANCE-BASED METHOD FOR EXTRACTING THE EFFECTIVE CHANNEL-LENGTH OF MOSFETS

Authors
LATIF Z ORTIZCONDE A LIOU JJ SANCHEZ FJG
Citation
Z. Latif et al., A STUDY OF THE VALIDITY OF CAPACITANCE-BASED METHOD FOR EXTRACTING THE EFFECTIVE CHANNEL-LENGTH OF MOSFETS, I.E.E.E. transactions on electron devices, 44(2), 1997, pp. 340-343
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
I.E.E.E. transactions on electron devices → ACNP
ISSN journal
00189383
Volume
44
Issue
2
Year of publication
1997
Pages
340 - 343
Database
ISI
SICI code
0018-9383(1997)44:2<340:ASOTVO>2.0.ZU;2-S
Abstract
The capacitance-based method (C-V method) is a straightforward method for extracting the effective channel length of MOSFET's. This paper in vestigates the validity of such a method based on results simulated fr om a two-dimensional (2-D) device simulator. Thr effective channel len gth extracted from the C-V method is also compared with those obtained from other methods reported in the literature.