A STUDY OF OPTICAL NOISE MEASUREMENT AS A RELIABILITY ESTIMATION FOR LASER-DIODES

Vandamme and Van Ruyven [in Noise in Physical System and 1/f Noise (Ed s M. Savelli et al..), pp. 245-247, Elsevier, Amsterdam (1983)] have h as pointed out that the influence of light output of a laser diode see ms a good criterion for accepting or rejecting lasers. In this paper, theoretical analysis has demonstrated that the optical noise of a lase r diode consists of not only a contribution from the defects in device s, but also a contribution from the fluctuation in gain and spontaneou s emission. Optical noise measurement and reliability testing for 30 V -groove InP/InGaAsP laser diodes have shown that the effect of reliabi lity estimation using optical noise measurement is worse than that usi ng terminal voltage noise measurement.