IDENTIFICATION OF THE SURFACE COMPONENTS IN THE HIGH-RESOLUTION SI 2PCORE-LEVEL SPECTRA OF THE LOW-INDEX SILICON SURFACES

This paper reports on recent synchrotron radiation photoelectron spect roscopy studies of the Si 2p core levels obtained with very high resol ution from the low-index silicon surfaces: Si(100), Si(111) and Si(110 ). Surface contributions are dearly noticed. They can be individually assigned to the respective constituent entities of the different recon structions. This puts into new perspective the spectroscopy and physic s (structure and electronics) of these prototypical silicon surfaces.