S. Tsukamoto et N. Koguchi, SURFACE RECONSTRUCTION OF SULFUR-TERMINATED GAAS(001) OBSERVED DURINGANNEALING PROCESS BY SCANNING-TUNNELING-MICROSCOPY, Journal of crystal growth, 150(1-4), 1995, pp. 33-37
The surface reconstruction of in-situ prepared sulfur-terminated (S-te
rminated) and sulfur-protected (S-protected) GaAs(001) is studied by s
canning tunneling microscopy (STM) at high temperatures of up to 260 d
egrees C. We demonstrate a new reordering process from the (4 x 6) Ga-
stabilized surface to the (2 x 6) S-stabilized surface and a novel met
hod of air protection using a S passivation layer. Moreover, the in-si
tu observation of the annealing process of this S-protection layer is
performed by high-temperature STM, avoiding the adsorption from enviro
nments and verifying that the (2 x 6) structure still becomes dominant
on the S-terminated GaAs(001) surface without the effects of As atoms
.