SCANNING-TUNNELING-MICROSCOPY OF THE GAAS (311)A SURFACE RECONSTRUCTION

Citation
M. Wassermeier et al., SCANNING-TUNNELING-MICROSCOPY OF THE GAAS (311)A SURFACE RECONSTRUCTION, Journal of crystal growth, 150(1-4), 1995, pp. 425-430
Citations number
18
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
150
Issue
1-4
Year of publication
1995
Part
1
Pages
425 - 430
Database
ISI
SICI code
0022-0248(1995)150:1-4<425:SOTG(S>2.0.ZU;2-L
Abstract
Reflection high-energy electron diffraction (RHEED) and scanning tunne ling microscopy (STM) are used to study the reconstruction of the GaAs (311)A surface. During and after molecular-beam epitaxy, in-situ RHEE D of the surface shows a lateral periodicity of 3.2 nm perpendicular t o the [2 $($) over bar$$ 33] direction. This periodicity is confirmed employing in-situ STM. The height of this periodic surface structure i s two monolayers, i.e., 0.34 nm. We show how this reconstruction, char acterized by a dimerization of the surface As atoms, can be formed usi ng a simple electron counting model. The excellent agreement with the experimental results further support this model, that was already foun d to explain the reconstructions of the (100) and (111) surfaces.