K. Verhaege et al., INFLUENCE OF TESTER, TEST METHOD, AND DEVICE TYPE ON CDM ESD TESTING, IEEE transactions on components, packaging, and manufacturing technology. Part A, 18(2), 1995, pp. 284-294
In this paper, the charged device model (CDM) electrostatic discharge
(ESD) events emulated by different commercial are studied, First, the
characteristic waveforms, defined by the EOS/ESD CDM ESD draft standar
d (DS5.3-1993) [1], are compared and some major problems related to th
e specification of socketed CDM testers are discussed, Second, the res
ults of an extensive CDM ESD test program are reported. The influences
of various test parameters, such as the charging method (direct or fi
eld), the discharge mode (contact or noncontact), the charge pin (subs
trate pin or pin to be discharged) and the device package are studied,
Finally, correlations of CDM ESD test results (the voltage thresholds
and electrical failure signatures) are investigated.