CATHODOLUMINESCENCE INVESTIGATION OF SIGE QUANTUM WIRES FABRICATED ONV-GROOVE PATTERNED SI SUBSTRATES
Citation
V. Higgs et al., CATHODOLUMINESCENCE INVESTIGATION OF SIGE QUANTUM WIRES FABRICATED ONV-GROOVE PATTERNED SI SUBSTRATES, Journal of crystal growth, 150(1-4), 1995, pp. 1070-1073
Categorie Soggetti
Crystallography
SICI code
0022-0248(1995)150:1-4<1070:CIOSQW>2.0.ZU;2-7
Abstract
Cathodoluminescence (CL) imaging and spectroscopy have been used to ch
aracterize SiGe quantum wires grown by gas source molecular beam epita
xy (GS-MBE) on V-groove patterned substrates. CL spectra recorded at T
approximate to 5 K contained three separate SiGe no-phonon luminescen
ce features and their transverse optic phonon replicas. Monochromatic
CL imaging recorded in cross section reveals that the three different
luminescence features are related to the SiGe(100) quantum wells, SiGe
(111) quantum wells and the SiGe quantum wire. CL images from the SiGe
(100) reveal that the low temperature (T = 5-30 K) images are broadene
d by exciton diffusion, whereas at higher temperatures (T = 30-70 K) t
he CL images become sharper due to non-excitonic recombination.