Jc. Harmand et al., CONTINUOUS MOLECULAR-BEAM EPITAXY OF ARSENIDES AND PHOSPHIDES APPLIEDTO DEVICE STRUCTURES ON INP SUBSTRATES, Journal of crystal growth, 150(1-4), 1995, pp. 1292-1296
We report on a standard molecular beam epitaxial (MBE) system devoted
to the growth on InP substrates and which is equipped with arsenic and
phosphorus solid sources. Procedures were developed to handle phospho
rus. The major donor impurity in InP epilayers was identified. The pho
sphorus source was applied to the InP substrate desoxidation under P-2
, and to the continuous growth of arsenide and phosphide layers, Low c
ross contamination by As or P was achieved by using valved cells. We i
ntroduced phosphide layers in structures for devices (lasers, photodet
ectors, heterojunction bipolar transistors (HBTs) and high electron mo
bility transistors (HEMTs). This allowed us to improve the device perf
ormance.