SPECTROSCOPIC CHARACTERIZATION OF THIN VANADIUM CARBIDE FILMS ON A VANADIUM(110) SURFACE - FORMATION, STABILITY, AND REACTIVITIES

Authors
CHEN JG DEVRIES BD FRUHBERGER B KIM CM LIU ZM
Citation
Jg. Chen et al., SPECTROSCOPIC CHARACTERIZATION OF THIN VANADIUM CARBIDE FILMS ON A VANADIUM(110) SURFACE - FORMATION, STABILITY, AND REACTIVITIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1600-1605
Citations number
21
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
13
Issue
3
Year of publication
1995
Part
2
Pages
1600 - 1605
Database
ISI
SICI code
0734-2101(1995)13:3<1600:SCOTVC>2.0.ZU;2-H