AUGER-ELECTRON SPECTROSCOPY X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OFTI-B-N THIN-FILMS

Authors
BAKER MA STEINER A HAUPT J GISSLER W
Citation
Ma. Baker et al., AUGER-ELECTRON SPECTROSCOPY X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OFTI-B-N THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1633-1638
Citations number
19
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
13
Issue
3
Year of publication
1995
Part
2
Pages
1633 - 1638
Database
ISI
SICI code
0734-2101(1995)13:3<1633:ASXPSO>2.0.ZU;2-J