INTERFACE CHARACTERIZATION OF AN INP INGAAS RESONANT-TUNNELING DIODE BY SCANNING-TUNNELING-MICROSCOPY/

Authors
WU W SKALA SL TUCKER JR LYDING JW SEABAUGH A BEAM EA JOVANOVIC D
Citation
W. Wu et al., INTERFACE CHARACTERIZATION OF AN INP INGAAS RESONANT-TUNNELING DIODE BY SCANNING-TUNNELING-MICROSCOPY/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 602-606
Citations number
20
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
13
Issue
3
Year of publication
1995
Part
1
Pages
602 - 606
Database
ISI
SICI code
0734-2101(1995)13:3<602:ICOAII>2.0.ZU;2-V