HETEROEPITAXIAL GROWTH OF C-70 FILMS ON MOS2(0001) AND THEIR CHARACTERIZATION BY LOW-ENERGY-ELECTRON DIFFRACTION AND PHOTOELECTRON-SPECTROSCOPY

Authors
HAN BY HEVESI K YU LM GENSTERBLUM G PIREAUX JJ THIRY PA CAUDANO R
Citation
By. Han et al., HETEROEPITAXIAL GROWTH OF C-70 FILMS ON MOS2(0001) AND THEIR CHARACTERIZATION BY LOW-ENERGY-ELECTRON DIFFRACTION AND PHOTOELECTRON-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1036-1039
Citations number
16
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
13
Issue
3
Year of publication
1995
Part
1
Pages
1036 - 1039
Database
ISI
SICI code
0734-2101(1995)13:3<1036:HGOCFO>2.0.ZU;2-1