SURFACE-ANALYSIS AT LOW TO ULTRAHIGH-VACUUM BY ION-SCATTERING AND DIRECT RECOIL SPECTROSCOPY

Authors
HAMMOND MS SCHULTZ JA KRAUSS AR
Citation
Ms. Hammond et al., SURFACE-ANALYSIS AT LOW TO ULTRAHIGH-VACUUM BY ION-SCATTERING AND DIRECT RECOIL SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1136-1144
Citations number
33
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
13
Issue
3
Year of publication
1995
Part
1
Pages
1136 - 1144
Database
ISI
SICI code
0734-2101(1995)13:3<1136:SALTUB>2.0.ZU;2-K