FOURIER FILTERING OF SYNCHROTRON WHITE-BEAM TOPOGRAPHS

Citation
M. Pilard et al., FOURIER FILTERING OF SYNCHROTRON WHITE-BEAM TOPOGRAPHS, Journal of applied crystallography, 28, 1995, pp. 279-288
Citations number
18
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
28
Year of publication
1995
Part
3
Pages
279 - 288
Database
ISI
SICI code
0021-8898(1995)28:<279:FFOSWT>2.0.ZU;2-B
Abstract
Numerical image treatment has been used for the enhancement and the an alysis of synchrotron white-beam topographs. Images are recorded eithe r during the experiment by means of an X-ray-sensitive camera or after the experiment from photographic films. Filters are designed to avoid artefacts such as the Gibbs effect. Filtering has been applied to the study of the propagation of surface acoustic waves in piezoelectric m aterials and ferromagnetic domains in Fe-Si crystals, illustrating the interest of Fourier filtering for a deep analysis of X-ray topographs .