The subject of the investigations are precipitation zones, which grew
as a result of chemical diffusion in AgPd30/CuSn6 bimetals. These prec
ipitation zones have been characterized by metallography, electron pro
be microanalysis and x-ray diffraction. The growth of precipitation zo
nes in the plating layer and in the substrate layer in dependence on t
ime have been determined. The use of x-ray diffraction alone for the i
dentification of the precipitates could not supply satisfying results
in every case. This problem was solved by the application of electron
probe microanalysis using a correction method, which allows the estima
tion of the chemical composition of small particles.