SURFACE-ANALYSIS BY TEY - THEORY AND APPLICATIONS

TEY (total electron yield) is frequently used to investigate EXAFS and XANES in the region of low photon energies and high photoabsorption c oefficients. We extended the application to quantitative surface analy sis [1,2]. For this purpose we developed by analogy to the theoretical approaches of quantitative X-ray fluorescence analysis a correlation between measured TEY-jumps at specific absorption edges of the specime n and the unknown composition. The present paper describes the derivat ion of the equations for primary and secondary excited contributions t o the measured TEY-jumps. We have checked our theory for the example o f binary Au-Pd alloys. Besides, the influence of a retarding field bet ween the specimen surface and the electron detector on the analytical results is outlined.