M. Kluckner et al., A METHOD TO CORRECT DEFOCUSED ELEMENT DISTRIBUTION MAPS IN ELECTRON-PROBE MICROANALYSIS, Mikrochimica acta, 125(1-4), 1997, pp. 229-234
Element distribution maps obtained on electron microprobes via the bea
m scan method with wavelength-dispersive spectrometers reveal a defocu
sing effect if they are taken at sufficiently small magnification. Thi
s effect, which occurs where the Bragg condition of the spectrometer i
s not adequately met, can be avoided or corrected by various methods.
A method is presented here to correct defocused element distribution m
aps with the help of corresponding maps obtained on homogeneous standa
rds.