A METHOD TO CORRECT DEFOCUSED ELEMENT DISTRIBUTION MAPS IN ELECTRON-PROBE MICROANALYSIS

Authors
KLUCKNER M BRANDL O WEINBRUCH S STADERMANN FJ ORTNER HM
Citation
M. Kluckner et al., A METHOD TO CORRECT DEFOCUSED ELEMENT DISTRIBUTION MAPS IN ELECTRON-PROBE MICROANALYSIS, Mikrochimica acta, 125(1-4), 1997, pp. 229-234
Citations number
9
Categorie Soggetti
Chemistry Analytical
Journal title
Mikrochimica acta → ACNP
ISSN journal
00263672
Volume
125
Issue
1-4
Year of publication
1997
Pages
229 - 234
Database
ISI
SICI code
0026-3672(1997)125:1-4<229:AMTCDE>2.0.ZU;2-7
Abstract
Element distribution maps obtained on electron microprobes via the bea m scan method with wavelength-dispersive spectrometers reveal a defocu sing effect if they are taken at sufficiently small magnification. Thi s effect, which occurs where the Bragg condition of the spectrometer i s not adequately met, can be avoided or corrected by various methods. A method is presented here to correct defocused element distribution m aps with the help of corresponding maps obtained on homogeneous standa rds.