MEASUREMENTS OF REFLECTED ELECTRON-ENERGY-LOSS SPECTROMETRY AND X-RAYPHOTOELECTRON-SPECTROSCOPY SPECTRA FOR DERIVATIONS OF THE ENERGY-LOSSFUNCTION AND SOURCE FUNCTION FOR AU 4F PHOTOELECTRONS
H. Yoshikawa et al., MEASUREMENTS OF REFLECTED ELECTRON-ENERGY-LOSS SPECTROMETRY AND X-RAYPHOTOELECTRON-SPECTROSCOPY SPECTRA FOR DERIVATIONS OF THE ENERGY-LOSSFUNCTION AND SOURCE FUNCTION FOR AU 4F PHOTOELECTRONS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(4), 1995, pp. 1984-1989
Citations number
21
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
An energy loss function for keV electrons from Au has been derived fro
m reflected electron energy loss spectrometry spectra using a Landau f
ormula modified to account for elastic scattering. The influence of th
e latter was analyzed using Monte Carlo analysis, The energy loss func
tion was verified by using it for background subtraction of the Au 4f
x-ray photoelectron spectroscopy spectrum according to Tougaard's meth
od. This approach led to a more reasonable source function, characteri
zed by two satellite peaks. Herman-Skillman atomic orbital calculation
, based on the Xa approximation, suggests these might correspond to sh
ake-up peaks associated with the Au 6s-->7s transition. (C) 1995 Ameri
can Vacuum Society.