FLUORESCENCE CORRECTIONS IN THIN-FILM TEXTURE ANALYSIS

Authors
CHATEIGNER D GERMI P PERNET M FRECHARD P ANDRIEU S
Citation
D. Chateigner et al., FLUORESCENCE CORRECTIONS IN THIN-FILM TEXTURE ANALYSIS, Journal of applied crystallography, 28, 1995, pp. 369-374
Citations number
14
Categorie Soggetti
Crystallography
Journal title
Journal of applied crystallography → ACNP
ISSN journal
00218898
Volume
28
Year of publication
1995
Part
4
Pages
369 - 374
Database
ISI
SICI code
0021-8898(1995)28:<369:FCITTA>2.0.ZU;2-B
Abstract
This paper reviews the transmission and reflection texture techniques in order to develop the correction formulae in each of these methods f or application to fluorescent thin-film analysis. The method is applie d to iron samples deposited on glass substrates in order to prove the efficiency of these corrections in the case of the Schulz reflection g eometry. The columnar growth of these films is shown to be dependent o n the incident flux inclination.