REALIZING A HIGH MEASURE OF CONFIDENCE FOR DEFECT LEVEL ANALYSIS OF RANDOM TESTING

The defect level in circuit testing is the percentage of circuits, suc h as chips, which are defective and shipped for use after testing. In this work, it is demonstrated that the defect level of testing a circu it using random patterns should have a probability distribution rather than just a single value. Based on this concept, the confidence degre e of a specified defect level for random testing can be derived, and t he quality of circuit random testing is thus guaranteed. Results obtai ned based on random testing can be extended to other test methods, e.g ., deterministic testing, pseudo-random testing, or functional testing , Experiments using computer simulation have been conducted for this w ork, and the results are very encouraging.