R. Thewes et al., EVALUATION OF THE HOT-CARRIER-INDUCED OFFSET VOLTAGE OF DIFFERENTIAL PAIRS IN ANALOG CMOS CIRCUITS, Quality and reliability engineering international, 11(4), 1995, pp. 273-277
Using a specifically developed measurement set-up and a test structure
typical for analogue applications, high precision measurements of the
stress-induced offset voltage degradation of differential pairs are p
resented. Extrapolation to operating conditions yields valuable inform
ation for analogue design in the sub-micron CMOS regime.