C. Russ et al., ESD PROTECTION ELEMENTS DURING HBM STRESS TESTS - FURTHER NUMERICAL AND EXPERIMENTAL RESULTS, Quality and reliability engineering international, 11(4), 1995, pp. 285-294
Correlation problems for HBM-ESD testing result from the complex inter
action between device and tester. The HBM stresses of different well-c
haracterized testers(1,2) are applied to protection elements. By means
of circuit simulations and in situ measurements, snapback and second
breakdown during HBM are investigated. For fast transient events, a ne
w transmission line approach of the tester improves the correlation be
tween experiment and simulation.