IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS

Authors
MANCA J DESCHEPPER L DECEUNINCK W DOLIESLAEGER M STALS LM
Citation
J. Manca et al., IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMS, Quality and reliability engineering international, 11(4), 1995, pp. 307-311
Citations number
8
Categorie Soggetti
Engineering
Journal title
Quality and reliability engineering international → ACNP
ISSN journal
07488017
Volume
11
Issue
4
Year of publication
1995
Pages
307 - 311
Database
ISI
SICI code
0748-8017(1995)11:4<307:IFITMS>2.0.ZU;2-8
Abstract
By means of in situ e.m.f.-measurements, leakage current measurements and impedance spectroscopy, it has been possible for the first time to detect spontaneous and forced blistering in thick film multilayers du ring formation at high temperatures. Also the occurrence of high tempe rature shorts in Ag-dielectric-Ag multilayers under DC-bias was detect able.