CHARACTERIZATION OF COMPLEX SILVER-HALIDE PHOTOGRAPHIC SYSTEMS BY MEANS OF ANALYTICAL ELECTRON-MICROSCOPY

Authors
OLESHKO V GIJBELS R JACOB W ALFIMOV M
Citation
V. Oleshko et al., CHARACTERIZATION OF COMPLEX SILVER-HALIDE PHOTOGRAPHIC SYSTEMS BY MEANS OF ANALYTICAL ELECTRON-MICROSCOPY, Microbeam analysis, 4(1), 1995, pp. 1-29
Citations number
109
Categorie Soggetti
Spectroscopy,Microscopy,"Instument & Instrumentation
Journal title
Microbeam analysis → ACNP
ISSN journal
10613420
Volume
4
Issue
1
Year of publication
1995
Pages
1 - 29
Database
ISI
SICI code
1061-3420(1995)4:1<1:COCSPS>2.0.ZU;2-M
Abstract
The potential of analytical electron microscopy (AEM) for studying sil ver halide photographic materials and their microcomponents is conside red. An optimum strategy for the application of AEM to multilevel stru ctural and analytical diagnosis of silver halide photographic systems is proposed and experimentally demonstrated. With the results presente d here, it possible to outline the main applications of AEM for the co mprehensive structural and analytical characterization of silver halid e cinematographic and photographic materials.