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Results:
1-15
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Results: 15
Authors:
NEWBURY D
ARMSTRONG J
Citation: D. Newbury et J. Armstrong, INTRODUCTION - SOFTWARE FOR MICROSCOPY AND MICROANALYSIS, Microbeam analysis, 4(3), 1995, pp. 123-123
Authors:
JOY DC
Citation: Dc. Joy, SEMLP - A MONTE-CARLO SIMULATION PROGRAM FOR SEM IMAGING, Microbeam analysis, 4(3), 1995, pp. 125-129
Authors:
LOWNEY JR
Citation: Jr. Lowney, MONSEL-II - MONTE-CARLO SIMULATION OF SEM SIGNALS FOR LINEWIDTH METROLOGY, Microbeam analysis, 4(3), 1995, pp. 131-136
Authors:
RASBAND WS
BRIGHT DS
Citation: Ws. Rasband et Ds. Bright, NIH IMAGE - A PUBLIC DOMAIN IMAGE-PROCESSING PROGRAM FOR THE MACINTOSH, Microbeam analysis, 4(3), 1995, pp. 137-149
Authors:
BRIGHT DS
Citation: Ds. Bright, MACLISPIX - A SPECIAL-PURPOSE PUBLIC DOMAIN IMAGE-ANALYSIS PROGRAM FOR THE MACINTOSH, Microbeam analysis, 4(3), 1995, pp. 151-163
Authors:
NEWBURY DE
MYKLEBUST RL
Citation: De. Newbury et Rl. Myklebust, NIST-MICRO-MC - A USERS GUIDE TO THE NIST MICROANALYSIS MONTE-CARLO ELECTRON TRAJECTORY SIMULATION PROGRAM, Microbeam analysis, 4(3), 1995, pp. 165-175
Authors:
ARMSTRONG JT
Citation: Jt. Armstrong, CITZAF - A PACKAGE OF CORRECTION PROGRAMS FOR THE QUANTITATIVE ELECTRON MICROBEAM X-RAY-ANALYSIS OF THICK POLISHED MATERIALS, THIN-FILMS, AND PARTICLES, Microbeam analysis, 4(3), 1995, pp. 177-200
Authors:
LINTON RW
Citation: Rw. Linton, MESSAGE FROM THE EDITOR-IN-CHIEF - INTERNATIONAL EFFORTS IN MICROBEAMANALYSIS, Microbeam analysis, 4(2), 1995, pp. 63-63
Authors:
LABAR JL
Citation: Jl. Labar, STANDARDLESS ELECTRON-PROBE X-RAY-ANALYSIS OF NONBIOLOGICAL SAMPLES, Microbeam analysis, 4(2), 1995, pp. 65-83
Authors:
TREBBIA P
WULVERYCK JM
BONNET N
Citation: P. Trebbia et al., PROGRESS IN QUANTITATIVE ELEMENTAL MAPPING BY X-RAY-IMAGING, Microbeam analysis, 4(2), 1995, pp. 85-102
Authors:
EECKHAOUDT S
JACOB W
VANGRIEKEN R
LANDSBERG J
WATT F
WITTERS H
Citation: S. Eeckhaoudt et al., MICROANALYTICAL STUDY OF THE ALUMINUM DISTRIBUTION IN BULLHEAD (ICTALURUS-NEBULOSUS) GILLS, Microbeam analysis, 4(2), 1995, pp. 103-117
Authors:
OLESHKO V
GIJBELS R
JACOB W
ALFIMOV M
Citation: V. Oleshko et al., CHARACTERIZATION OF COMPLEX SILVER-HALIDE PHOTOGRAPHIC SYSTEMS BY MEANS OF ANALYTICAL ELECTRON-MICROSCOPY, Microbeam analysis, 4(1), 1995, pp. 1-29
Authors:
FREEMAN GB
STARR TL
LACKEY WJ
HANIGOFSKY JA
Citation: Gb. Freeman et al., LOW-VOLTAGE ENERGY-DISPERSIVE X-RAY LIGHT-ELEMENT ANALYSIS OF CERAMICMATERIALS AND COATINGS, Microbeam analysis, 4(1), 1995, pp. 31-40
Authors:
GRIMM R
CHEN ZW
WITTRY DB
Citation: R. Grimm et al., FABRICATION AND PROPERTIES OF A LOGARITHMIC SPIRAL DIFFRACTOR FOR CALCIUM X-RAYS, Microbeam analysis, 4(1), 1995, pp. 41-46
Authors:
BURNS MS
TAFFET R
HITZMAN CJ
Citation: Ms. Burns et al., INWARD PERMEABILITY OF LITHIUM AND RUBIDIUM FOLLOWING LIGHT EXPOSURE TO THE RAT RETINA MEASURED BY SIMS, Microbeam analysis, 4(1), 1995, pp. 47-57
Risultati:
1-15
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