PROGRESS IN QUANTITATIVE ELEMENTAL MAPPING BY X-RAY-IMAGING

We demonstrate through different simulations that multivariate statist ics can be successfully used for measuring accurate quantitative, elem ental maps from transmitted X-ray images obtained from an unknown obje ct made of several atomic species. We discuss the robustness of the pr oposed method when confronting different situations: use of cross sect ions measured on standards of unknown thicknesses instead of tabulated values, unknown and even variable object thickness, noisy (Poissonian ) images, detection of low atomic concentration, induced error if the number or the identity of the atomic species supposed to be present in the object is wrong. The results presented in this paper are not rela ted to electron probe microanalysis and may potentially concern any re search group using any kind of micro- or macroradiographic system.