THE HREM USE OF THE FEGTEM FOR THE STUDY OF INTERFACES

Citation
Sh. Stobbs et al., THE HREM USE OF THE FEGTEM FOR THE STUDY OF INTERFACES, Ultramicroscopy, 58(3-4), 1995, pp. 275-287
Citations number
34
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
58
Issue
3-4
Year of publication
1995
Pages
275 - 287
Database
ISI
SICI code
0304-3991(1995)58:3-4<275:THUOTF>2.0.ZU;2-5
Abstract
A comparison is made of current approaches to the characterisation of the abruptness of an interface based upon, on the one hand, attempts t o derive the exit wavefunction from a through focal image series and, on the other, indirect methods which seek to quantify the delocalised contrast seen at such interfaces as a function of the defocus. It is d emonstrated that the delocalised contrast due to the presence of a lat eral discontinuity in the projected forward scattering potential is bo th highly sensitive to the form of the local changes in the scattering behaviour for images at large defoci and also then potentially of ext remely high contrast under the high spatial coherence conditions chara cteristic of the use of a FEGTEM. Given the problems inherent in the r econstruction of the exit wave function it is thus argued that if the primary interest is in the characterisation of an interface then indir ect approaches would appear to be currently more useful than those bas ed on attempts to derive pictures from the amplitude and phase of the exit wavefunctions. We suggest that this will be the case whether thes e pictures be obtained by filtering non-linear contributions to the ex perimental images or by full recursive restorations which potentially retain these non-linear contributions.