AUTOMATIC PARTICLE PICKING FROM ELECTRON-MICROGRAPHS

A computer program for automatic particle picking based on textural me thods is proposed. The technique relies on the evaluation of certain t extural parameters for data windows containing single particles, and t hose containing undesirable material. These parameters are manipulated by a discriminant analysis routine for determining the rules of class ification between the different categories. The effectiveness of the m ethod was demonstrated by application to electron micrographs of 70S E scherichia coli ribosomes.