CURRENT TRANSPORT IN ALGAAS GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS OPERATING BETWEEN 300 AND 500 K/

Citation
Cs. Ho et al., CURRENT TRANSPORT IN ALGAAS GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS OPERATING BETWEEN 300 AND 500 K/, Solid-state electronics, 38(10), 1995, pp. 1759-1763
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
38
Issue
10
Year of publication
1995
Pages
1759 - 1763
Database
ISI
SICI code
0038-1101(1995)38:10<1759:CTIAGH>2.0.ZU;2-9
Abstract
The current transport in AlGaAs/GaAs heterojunction bipolar transistor s (HBTs) operating in the temperature range of 300-500 K is investigat ed based on an analytical model including the lattice heating effect. It is found that an uneven increase in the base and collector currents gives rise to the current gain degradation at high temperatures. In a ddition, the study suggests that the effect of lattice heating becomes more important if the HBT area is reduced and/or the ambient temperat ure is increased. Experimental data and results simulated from a devic e simulator are included in support of our finding.