M. Zamora et al., INTERFACE STATES CAPACITANCE IN AUPTTI NGAAS SCHOTTKY CONTACTS - A MODIFIED SCHOTTKY CAPACITANCE SPECTROSCOPY METHOD/, Solid-state electronics, 38(10), 1995, pp. 1771-1774
In this paper, limitations of the Schottky Capacitance Spectroscopy (S
CS) method are discussed and modifications of the method for low forwa
rd bias and high frequency are proposed. It is shown that simplificati
ons commonly accepted in the SCS method can lead to erroneous conclusi
ons as to the cut-off frequency and hence the interface states paramet
ers. A modified SCS method is used in the interface states capacitance
measurements in AuPtTi/nGaAs Schottky diodes.