SIMULATION OF THE EXTENDED FINE-STRUCTURE OF K-SHELL EDGES IN INTERMETALLIC ORDERED ALLOYS

The extended fine structure of K-edges ranging from Al-K to Cr-K in me tals (Al, Ti, V, Cr) and binary intermetallic compounds (TiAl) has bee n recorded by X-ray absorption spectrometry (XAS) and/or electron ener gy-loss spectrometry (EELS). It is found that EEL spectrometry can be used reliably up to energy losses of 7 keV which have generally not be en considered with this technique. Simulation of the experimental data have been performed through the so-called standard EXAFS method and u sing the ''ab-initio'' code FEFF which allows a high-order multiple sc attering calculation.