SIMULATION OF THE EXTENDED FINE-STRUCTURE OF K-SHELL EDGES IN INTERMETALLIC ORDERED ALLOYS

Citation
G. Hug et al., SIMULATION OF THE EXTENDED FINE-STRUCTURE OF K-SHELL EDGES IN INTERMETALLIC ORDERED ALLOYS, Ultramicroscopy, 59(1-4), 1995, pp. 121-136
Citations number
26
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
59
Issue
1-4
Year of publication
1995
Pages
121 - 136
Database
ISI
SICI code
0304-3991(1995)59:1-4<121:SOTEFO>2.0.ZU;2-O
Abstract
The extended fine structure of K-edges ranging from Al-K to Cr-K in me tals (Al, Ti, V, Cr) and binary intermetallic compounds (TiAl) has bee n recorded by X-ray absorption spectrometry (XAS) and/or electron ener gy-loss spectrometry (EELS). It is found that EEL spectrometry can be used reliably up to energy losses of 7 keV which have generally not be en considered with this technique. Simulation of the experimental data have been performed through the so-called standard EXAFS method and u sing the ''ab-initio'' code FEFF which allows a high-order multiple sc attering calculation.