The extended fine structure of K-edges ranging from Al-K to Cr-K in me
tals (Al, Ti, V, Cr) and binary intermetallic compounds (TiAl) has bee
n recorded by X-ray absorption spectrometry (XAS) and/or electron ener
gy-loss spectrometry (EELS). It is found that EEL spectrometry can be
used reliably up to energy losses of 7 keV which have generally not be
en considered with this technique. Simulation of the experimental data
have been performed through the so-called standard EXAFS method and u
sing the ''ab-initio'' code FEFF which allows a high-order multiple sc
attering calculation.