Ts. Lee et al., THERMOMIGRATION OF TELLURIUM PRECIPITATES IN CDZNTE CRYSTALS GROWN BYVERTICAL BRIDGMAN METHOD, Journal of electronic materials, 24(9), 1995, pp. 1053-1056
Te precipitates in CdZnTe have been characterized by x-ray diffraction
at room and higher temperatures. From the x-ray results at room tempe
rature, it has been confirmed that Te precipitates in CdZnTe have the
same structural phase as observed in elemental Te under high pressure.
The x-ray results at higher temperature indicate that Te precipitates
melt around 440 degrees C. CdZnTe samples containing Te precipitates
have been annealed at temperatures below and above 440 degrees C with
thermal gradient of similar to 70 degrees C/cm. Results of the observa
tion with infrared microscope before and after the annealings indicate
distinct occurrence of thermomigration of Te precipitates in samples
annealed at temperature above 440 degrees C compared with ones anneale
d at temperature below 440 degrees C. Thermomigration velocity obtaine
d from these results is similar to 50 mu m/h. The average value for th
e effective diffusion coefficient of the metallic atoms in Te precipit
ates calculated by using the thermomigration velocity is similar to 3
x 10(-5) cm(2)/s.