CHARACTERIZATION OF MOLECULAR-BEAM EPITAXIALLY GROWN HGCDTE EPILAYERSBY MIDINFRARED INTERBAND MAGNETOABSORPTION

Citation
P. Helgesen et al., CHARACTERIZATION OF MOLECULAR-BEAM EPITAXIALLY GROWN HGCDTE EPILAYERSBY MIDINFRARED INTERBAND MAGNETOABSORPTION, Journal of electronic materials, 24(9), 1995, pp. 1263-1268
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
24
Issue
9
Year of publication
1995
Pages
1263 - 1268
Database
ISI
SICI code
0361-5235(1995)24:9<1263:COMEGH>2.0.ZU;2-J
Abstract
Interband magneto-absorption is used to characterize molecular beam ep itaxially (MBE) grown HgCdTe epilayers. Both the bandgap and the Moss- Burstein shift in n-doped layers are determined from the experiments. A heterostructure sample consisting of four layers with different comp ositions is also analyzed. Due to the good experimental sensitivity al l four bandgaps are determined, in contrast to optical transmission an alysis without a magnetic field where only the lowest gap is readily v isible. the interband magneto-absorption signal strongly depends on th e electron mobility. This has been used as an aid to optimizing the MB E growth conditions of HgCdTe layers on different substrate orientatio ns.