F. Scholz et al., LOW-PRESSURE METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF GAN GAINN HETEROSTRUCTURES/, Solid-state electronics, 41(2), 1997, pp. 141-144
GaN layers with different nucleation techniques have been grown by met
alorganic vapor phase epitaxy. At atmospheric pressure, no epitaxial l
ayer growth occurred, whereas at low pressure the GaN quality could be
drastically improved by an AIN nucleation layer. Excellent material p
roperties have been found by photoluminescence, X-ray diffraction and
Hall experiments. The incorporation of In in GaInN could be enhanced b
y a reduction of both growth temperature and reactor pressure. GaInN q
uantum wells grown at 700 degrees C show fairly strong photoluminescen
ce peaks. (C) 1997 Elsevier Science Ltd.