LOW-PRESSURE METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF GAN GAINN HETEROSTRUCTURES/

Citation
F. Scholz et al., LOW-PRESSURE METALORGANIC VAPOR-PHASE EPITAXIAL-GROWTH OF GAN GAINN HETEROSTRUCTURES/, Solid-state electronics, 41(2), 1997, pp. 141-144
Citations number
15
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
41
Issue
2
Year of publication
1997
Pages
141 - 144
Database
ISI
SICI code
0038-1101(1997)41:2<141:LMVEOG>2.0.ZU;2-A
Abstract
GaN layers with different nucleation techniques have been grown by met alorganic vapor phase epitaxy. At atmospheric pressure, no epitaxial l ayer growth occurred, whereas at low pressure the GaN quality could be drastically improved by an AIN nucleation layer. Excellent material p roperties have been found by photoluminescence, X-ray diffraction and Hall experiments. The incorporation of In in GaInN could be enhanced b y a reduction of both growth temperature and reactor pressure. GaInN q uantum wells grown at 700 degrees C show fairly strong photoluminescen ce peaks. (C) 1997 Elsevier Science Ltd.