H. Yaguchi et al., NITROGEN CONCENTRATION-DEPENDENCE OF PHOTOLUMINESCENCE DECAY TIME IN GAP1-XNX ALLOYS, Solid-state electronics, 41(2), 1997, pp. 231-233
We report on the nitrogen concentration dependence of photoluminescenc
e (PL) properties in GaP1-xNx alloys. Time-resolved PL measurements re
veal that the radiative transition and relaxation processes in GaP1-xN
x alloys with high nitrogen concentrations are significantly different
from those with low concentrations where NNi lines are clearly observ
ed. The PL decay profile shows two distinct exponential processes with
fast and slow decay times for high concentrations. With increasing N
concentration, the fast decay component becomes dominant and the slow
decay time becomes longer. The fast decay is attributed to the relaxat
ion to nonradiative recombination centers. The slow decay indicates th
e long radiative lifetime due to the weak localization of excitons and
the slow relaxation due to the scattered spatial distribution of the
states. This is consistent with the fact that the PL occurs at the tai
ls of the density of states. (C) 1997 Elsevier Science Ltd.