A QUANTITATIVE MEASURE FOR THE GOODNESS-OF-FIT IN PROFILE REFINEMENTSWITH MORE THAN 20 DEGREES OF FREEDOM

Authors
Citation
J. Ihringer, A QUANTITATIVE MEASURE FOR THE GOODNESS-OF-FIT IN PROFILE REFINEMENTSWITH MORE THAN 20 DEGREES OF FREEDOM, Journal of applied crystallography, 28, 1995, pp. 618-619
Citations number
12
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
28
Year of publication
1995
Part
5
Pages
618 - 619
Database
ISI
SICI code
0021-8898(1995)28:<618:AQMFTG>2.0.ZU;2-7
Abstract
A quality indicator N-sigma is defined that exhibits immediately the s ignificance level of the result of a least-squares refinement. For a r efinement with nu degrees of freedom, N-sigma = (M- nu)/(2 nu)(1/2) ex presses the deviation of the deviance M from its expected value nu in terms of its standard deviation (2 nu)(1/2) The deviance M is the sum of weighted squared differences between observed and model data. For a ny nu > 20, \N-sigma\ should be as small as possible; however, it shou ld be <3 for a sufficiently good refinement. Thus, N-sigma is a quanti tative measure for the conformity of data, their weights and the model , independent of the number of the degrees of freedom nu.