FRENCH-JAPANESE SEMINAR ON IN-SITU ELECTRON-MICROSCOPY - NOVEMBER 9-12, 1992 NAGOYA, JAPAN - PREFACE

Authors
CAILLARD D LOUCHET F SAKA H
Citation
D. Caillard et al., FRENCH-JAPANESE SEMINAR ON IN-SITU ELECTRON-MICROSCOPY - NOVEMBER 9-12, 1992 NAGOYA, JAPAN - PREFACE, Microscopy microanalysis microstructures, 4(2-3), 1993, pp. 180000005-180000005
Citations number
NO
Categorie Soggetti
Spectroscopy,Microscopy
Journal title
Microscopy microanalysis microstructures → ACNP
ISSN journal
11542799
Volume
4
Issue
2-3
Year of publication
1993
Pages
180000005 - 180000005
Database
ISI
SICI code
1154-2799(1993)4:2-3<180000005:FSOIE->2.0.ZU;2-F