D. Rajavel et Jj. Zinck, GROWTH-KINETICS AND PROPERTIES OF HETEROEPITAXIAL (CD,ZN)TE FILMS PREPARED BY METALORGANIC MOLECULAR-BEAM EPITAXY, Journal of electronic materials, 22(8), 1993, pp. 803-808
Thermally precracked diethylzinc, dimethylcadmium, and diethyltellurid
e were used for the metalorganic molecular beam epitaxial growth of (0
01) ZnTe, CdTe, and CdZnTe films on GaAs substrates. Measurements of t
he growth rate as a function of the substrate temperature and the II/V
I ratio were used to determine the growth kinetics of (001) ZnTe and C
dTe. (001) CdTe, ZnTe, and CdZnTe films were deposited under near-stoi
chiometric growth conditions, as determined from the growth kinetics.
The best heteroepitaxial films exhibited x-ray rocking curve full widt
hs at half maximum of 200-210 arc-s. The photoluminescence spectra of
the binary and ternary films at 5K were dominated by features associat
ed with bound and free excitons. Secondary ion mass spectrometry measu
rements showed that the films were free of carbon and oxygen. A new me
rcury precursor, divinylmercury, was used for HgTe growth. Preliminary
results indicated that divinylmercury is a viable mercury source for
metalorganic molecular beam epitaxial growth when it is precracked.