J. Baars et al., CHARACTERIZATION OF HG1-XCDXTE HETEROSTRUCTURES BY THERMOELECTRIC MEASUREMENTS, Journal of electronic materials, 22(8), 1993, pp. 923-929
P-on-n mercury cadmium telluride (MCT) heterostructures grown by MOCVD
with As and In as n- and p-type dopants, respectively, are examined b
y measuring the Seebeck and Hall coefficients between 20 and 320K. The
results are analyzed regarding doping and composition of the layers b
y least squares fitting the experimental profiles with the calculated
temperature dependencies. The electron and hole densities of the layer
s are calculated taking into account Fermi-Dirac statistics, a nonpara
bolic conduction band, a parabolic valence band, a discrete acceptor l
evel, and fully ionized donors. For the Seebeck coefficient, the relat
ion we previously showed to be valid for p-type MCT1 is used. This rel
ation relies on the thermoelectric effect in a temperature gradient re
sulting from the diffusion of nondegenerate carriers scattered by LO-p
honons. It also fits the observed thermoelectric properties of n-type
MCT in a wide temperature range. The doping and structural parameters
determined from the thermoelectric measurements agreed very well with
As and In profiles obtained from secondary ion mass spectroscopy measu
rements and the data obtained from analyses of infrared transmission m
easurements.