PROPERTIES OF INAS (GA,IN)SB STRAINED-LAYER SUPERLATTICES GROWN ON THE (111) ORIENTATIONS/

Citation
Ja. Dura et al., PROPERTIES OF INAS (GA,IN)SB STRAINED-LAYER SUPERLATTICES GROWN ON THE (111) ORIENTATIONS/, Journal of electronic materials, 22(8), 1993, pp. 1087-1091
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
22
Issue
8
Year of publication
1993
Pages
1087 - 1091
Database
ISI
SICI code
0361-5235(1993)22:8<1087:POI(SS>2.0.ZU;2-D
Abstract
Following the proposal of the extreme type-II InAs/(Ga,In)Sb strained layer superlattice system by Mailhiot and Smith in 1987 for long wavel ength infrared detection, a number of groups have experimentally inves tigated (100) oriented InAs/(Ga,In)Sb strained layer superlattices and demonstrated that these structures can possess energy gaps in the 8-1 2 mum range with absorption coefficients comparable to HgCdTe. However , a number of advantages are predicted if these structures are grown o n the {111} orientations. In this paper, we present details of our inv estigation of the growth of InAs/GaSb heterostructures and InAs/(Ga,In )Sb strained layer superlattices on the (111)A and (111)B orientations by molecular beam epitaxy, compared to growth on the (100) orientatio n. Heterojunction growth and incorporation rates of Sb (As) into InAs (GaSb) on (111)A, (111)B, and (100) orientations have been assessed an d implications for growth and optical properties of InAs/(Ga,In)Sb str ained layer superlattices are discussed. GaSb/InAs and InAs/GaSb inter faces on the (111)B orientation are investigated by x-ray photoelectro n spectroscopy, and the structural quality of InAs/(Ga,In)Sb strained layer superlattices are investigated by x-ray diffraction.